Fault injection in early microarchitecture-level simulation CPU models and beam
experiments on the final physical CPU chip are two established methodologies to access the …

In this paper, we present a fine-grained characterization of the impact of transient faults (soft
errors) on program execution for different compiler optimization levels and two out-of-order …

Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …

Radiation-induced soft errors have become a key challenge in advanced commercial
electronic components and systems. We present results of Soft Error Rate (SER) analysis of …

Miniaturization of integrated circuits brings more devices (thus more functionality) on the
same silicon area but also makes them more vulnerable to soft (transient) errors …

Graphics Processing Units (GPUs) have moved from being dedicated devices for multimedia
and gaming applications to general-purpose accelerators employed in High-Performance …

Deep neural networks (DNNs) in safety-critical applications demand high reliability even
when running on edge-computing devices. Recent works on System-on-Chip (SoC) design …

Microprocessor power consumption and dependability are both crucial challenges that
designers have to cope with due to shrinking feature sizes and increasing transistor counts …

The increased need for computing capabilities and higher efficiency have stimulated
industries to make available in the market novel architectures with increased complexity …

We present an in-depth analysis of transient faults effects on HPC applications in Intel Xeon
Phi processors based on radiation experiments and high-level fault injection. Besides …