Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
design of a microprocessor-based system. Nevertheless, deciding how to distribute the error …

Reliability is of great concern to the scalability of extreme-scale systems. Of particular
concern are soft errors in main memory, which are a leading cause of failures on current …

Soft Error Resiliency is a major concern for Petascale high performance computing (HPC)
systems. Blue Gene/Q (BG/Q) is the third generation of IBM's massively parallel, energy …

Microprocessor power consumption and dependability are both crucial challenges that
designers have to cope with due to shrinking feature sizes and increasing transistor counts …

In this paper, we compare how radiation-induced soft errors affect the execution results of
user-level applications on different processor cores that implement the same instruction set …

In this paper, we investigate the impact of register file errors in modern embedded
microprocessors reliability through fault-injection and heavy-ion experiments. Additionally …

Current trends in device scaling continue to cause an increasing risk of transient faults in
microprocessors due to high energy strikes from radiated particles. In this work, we present a …

As the dimensions and operating voltages of computer electronics shrink to satisfy
consumers' insatiable demand for higher density, greater functionality, and lower power …

Radiation-induced soft errors are a major reliability concern in circuits fabricated at
advanced technology nodes. Online soft-error vulnerability estimation offers the flexibility of …

Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …