Soft errors have been a concern in memory reliability for many years. With device feature
size decreasing and memories density increasing, a single event upset (SEU) in memory …

Soft errors have been a concern in memories for many years. In older technologies, soft
errors typically affected a single memory cell but as technology scaled, Multiple Cell Upsets …

Error correction codes (ECCs) are commonly used to protect memories from errors. As
multibit errors become more frequent, single error correction codes are not enough and …

Error Correction Codes (ECCs) are commonly used to protect memories against soft errors
with an impact on memory area and delay. For large memories, the area overhead is mostly …

As CMOS technology size scales down, multiple cell upsets (MCUs) caused by a single
radiation particle have become one of the most challenging reliability issues for memories …

Reliability is a major concern in advanced electronic circuits. Errors caused for example by
radiation become more common as technology scales. To ensure that those errors do not …

As multiple cell upsets (MCUs) become more frequent on SRAM memory devices, there is a
growing interest on error correction codes that can correct multibit errors. Orthogonal Latin …

Memories are commonly protected with error correction codes to avoid data corruption when
a soft error occurs. Traditionally, per-word single error correction (SEC) codes are used. This …

Error correction codes (ECCs) are commonly used to protect memories against errors.
Among ECCs, orthogonal latin squares (OLS) codes have gained renewed interest for …

The use of error-correcting codes is a common strategy to protect memories from errors.
Single-error correction, double-error detection linear block codes have been traditionally …