We devised a method for the reliable electrical testing of nanoscale wire arrays using
conducting probe atomic force microscopy (AFM) in ambient conditions. A key requirement …

In nanopotentiometry a conductive atomic force microscope tip is used as a voltage probe in
order to measure the distribution of the electrical potential on the cross section of an …

As the size of electronic devices continues to shrink, characterization methods capable of
precisely probing localized properties become increasingly important. Scanning probe …

We have investigated the reliability of a variety of metal coated and semiconductor tips for
use in conducting atomic force microscopy experiments in an ultrahigh vacuum (UHV) …

The availability of very sharp, wear-proof, electrically conductive probes is one crucial issue
for conductive atomic force microscopy (AFM) techniques such as scanning capacitance …

Conductive atomic force microscopy (CAFM) has become the preferred tool of many
companies and academics to analyze the electronic properties of materials and devices at …

The invention of scanning tunneling microscopy (STM), rapidly followed by atomic force
microscopy (AFM), occurred at the time when extensive research on sub-µm metal oxide …

We present the realization and performance of a multiprobe microcontactor made of an array
of metallic microcantilevers inserted in an atomic force microscope AFM. This instrument …

Atomic force microscopy (AFM) is an essential nanoinstrument technique for several
applications such as cell biology and nanoelectronics metrology and inspection. The need …

We demonstrate a method that allows the controlled writing of metallic patterns on the
nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano …