We have measured the intrinsic electrical resistivities, ρ (T), of three individual single- crystalline ZnO nanowires (NWs) from 320 down to 1.3 K. The NWs were synthesized via …
JE Stehr, SL Chen, S Filippov, M Devika… - …, 2012 - iopscience.iop.org
Optically detected magnetic resonance (ODMR) complemented by photoluminescence measurements is used to evaluate optical and defect properties of ZnO nanowires (NWs) …
DH Weber, A Beyer, B Völkel, A Gölzhäuser… - Applied Physics …, 2007 - pubs.aip.org
A low energy electron point source microscope is used to determine the electrical conductivity of freestanding ZnO nanowires. The nanowires were contacted with a …
KH Liu, P Gao, Z Xu, XD Bai, EG Wang - Applied Physics Letters, 2008 - pubs.aip.org
In situ electrical transport measurements on individual bent ZnO nanowires have been performed inside a high-resolution transmission electron microscope, where the crystal …
We report here investigations of crystal and electronic structure of as-synthesized and annealed ZnO nanobelts by an in-situ high-resolution transmission electron microscope …
M Bah, TS Tlemcani, S Boubenia, C Justeau… - Nanoscale …, 2022 - pubs.rsc.org
ZnO nanowires (NWs) are very attractive for a wide range of nanotechnological applications owing to their tunable electron concentration via structural and surface defect engineering. A …
X Lin, XB He, TZ Yang, W Guo, DX Shi, HJ Gao… - Applied physics …, 2006 - pubs.aip.org
We report intrinsic current-voltage properties of ZnO nanowire measured by a four-tip scanning tunneling microscopy (F-STM). It is found that after bending the nanowire with the …
A Djoulde, TL Mamela, W Su, L Kong… - ACS Applied Nano …, 2022 - ACS Publications
Electrical characterization of semiconducting oxide nanowires (NWs) is mostly performed using complex techniques, which necessitates a series of costly nanofabrication procedures …
Y Liu, S Wang, ZY Zhang, LM Peng, L Shi… - Applied Physics …, 2008 - pubs.aip.org
Direct measurements on electrical characteristics have been carried out in situ inside a scanning electron microscope using a multiple nanoprobe system on individual Sn O 2 …