[PDF][PDF] Study of single-event transient effects on analog circuits

T Wang - 2011 - harvest.usask.ca
Radiation in space is potentially hazardous to microelectronic circuits and systems such as
spacecraft electronics. Transient effects on circuits and systems from high energetic particles …

[PDF][PDF] Single event upset (SEU) in SRAM

G Saxena, R Agrawal, S Sharma - Int. J. Eng. Res. Appl, 2013 - Citeseer
Radiation in space is potentially hazardous to microelectronic circuits and systems such as
spacecraft electronics. Transient effects on circuits and systems from high energetic particles …

Understanding single-Event effects in FPGA for Avionic system design

B Vibishna, KS Beenamole, AK Singh - IETE Technical Review, 2013 - Taylor & Francis
Radiation has proven to cause transient and permanent failures in the semiconductors.
When an energetic radiation particle strikes the semiconductor substrate, single-event …

Radiation Effects of Advanced Electronic Devices and Circuits

Y Chi, C Cai, L Cai - Electronics, 2024 - mdpi.com
Research on the effects of radiation on advanced electronic devices and integrated circuits
has experienced rapid growth over the last few years, resulting in many approaches being …

[PDF][PDF] Single event effect mitigation in digital integrated circuits for space

R Weigand - topical Workshop on Electronics for Particle Physics, 2010 - indico.cern.ch
Single Event Effect Mitigation in Digital Integrated Circuits for Space Page 1 TWEPP 2010 21
September 2010 (1) Single Event Effect Mitigation in Digital Integrated Circuits for Space …

Radiation tolerant electronics

P Leroux - Electronics, 2019 - mdpi.com
Research on radiation tolerant electronics has increased rapidly over the last few years,
resulting in many interesting approaches to model radiation effects and design radiation …

Radiation hardened by design technique to mitigate single event transients in combinational logic circuits

TV Reddy, S Nakhate - 2017 International Conference on …, 2017 - ieeexplore.ieee.org
Single event transients (SETs) have become increasingly problematic for both
combinational and sequential VLSI circuits in the deep submicron technology (DSM). This is …

Single event effects in the nano era

ML Alles, LW Massengill, RD Schrimpf… - … Journal of High …, 2008 - World Scientific
Scaling of complementary metal oxide semiconductor (CMOS) technologies to the sub-100
nm dimension regime increase the sensitivity to pervasive terrestrial radiation. Diminishing …

[图书][B] An Innovative Radiation Hardened By Design Flip-Flop

B Matush - 2010 - search.proquest.com
Radiation hardening by design (RHBD) has become a necessary practice when creating
circuits to operate within radiated environments. While employing RHBD techniques has …

[PDF][PDF] Study of radiation effects on 28nm UTBB FDSOI technology

R Liu - 2017 - harvest.usask.ca
With the evolution of modern Complementary Metal-Oxide-Semiconductor (CMOS)
technology, transistor feature size has been scaled down to nanometers. The scaling has …