Soft error resilience has become an essential design metric in electronic computing systems
as advanced technology nodes have become less robust to high‐charged particle effects …

Reliability is rapidly emerging as a major design metric in both embedded and high
performance computing (HPC) domains. Such systems are integrating modern multicore …

With aggressive technology scaling, soft errors have become a major threat in modern
computing systems. Several techniques have been proposed in the literature and …

Fault injection in early microarchitecture-level simulation CPU models and beam
experiments on the final physical CPU chip are two established methodologies to access the …

Increasing chip power densities allied to the continuous technology shrink are making
emerging multiprocessor embedded systems more vulnerable to radiation-induced transient …

Virtual platform frameworks have been extended to allow earlier soft error analysis of more
realistic multicore systems (ie, real software stacks and state-of-the-art ISAs). The high …

Soft errors are a major safety concern in many devices, eg, in automotive, industrial, control
or medical applications. Ideally, safety-critical systems should be resilient against the impact …

Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …

Full chip statistical fault injection has been performed on a hardware emulated POWER6
platform. These results were validated against proton beam injection results. The fault …

Fault tolerance is a key requirement in several application domains of embedded
processors cores. In a wide variety of applications, however, a full protection against faults …