Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

L Wang, S Guillemin, JM Chauveau… - … status solidi (c), 2016 - Wiley Online Library
Scanning capacitance microscopy (SCM) has been investigated on Ga doped ZnO staircase
multi‐layers grown by molecular beam epitaxy (MBE) and ZnO NWs grown by chemical bath …

Nanoscale calibration of n-type ZnO staircase structures by scanning capacitance microscopy

L Wang, J Laurent, JM Chauveau, V Sallet… - Applied Physics …, 2015 - pubs.aip.org
Cross-sectional scanning capacitance microscopy (SCM) was performed on n-type ZnO
multi-layer structures homoepitaxially grown by molecular beam epitaxy method. Highly …

Electrical properties of ZnO nanowire field effect transistors characterized with scanning probes

Z Fan, JG Lu - Applied Physics Letters, 2005 - pubs.aip.org
Single ZnO nanowires are configured as field effect transistors and their electrical properties
are characterized using scanning probe microscopy (SPM). Scanning surface potential …

Determination of carrier density of ZnO nanowires by electrochemical techniques

I Mora-Seró, F Fabregat-Santiago, B Denier… - Applied physics …, 2006 - pubs.aip.org
The carrier density of ZnO nanowires has been determined by means of electrochemical
impedance spectroscopy. A model taking into account the geometry of ZnO nanowires has …

Cross-section imaging and p-type doping assessment of ZnO/ZnO: Sb core-shell nanowires by scanning capacitance microscopy and scanning spreading resistance …

L Wang, V Sallet, C Sartel, G Brémond - Applied Physics Letters, 2016 - pubs.aip.org
ZnO/ZnO: Sb core-shell structured nanowires (NWs) were grown by the metal organic
chemical vapor deposition method where the shell was doped with antimony (Sb) in an …

Electrodeposition and impedance spectroscopy characterization of ZnO nanowire arrays

R Tena‐Zaera, J Elias, C Lévy‐Clément… - … status solidi (a), 2008 - Wiley Online Library
An overview of the electrodeposition of ZnO nanowire arrays from the reduction of dissolved
molecular oxygen in zinc chloride solutions was reported. In spite of the internal structure of …

Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy

L Wang, JM Chauveau, R Brenier, V Sallet… - Applied Physics …, 2016 - pubs.aip.org
Scanning spreading resistance microscopy (SSRM) was performed on non-intentionally
doped (nid) ZnO nanowires (NWs) grown by metal-organic chemical vapor deposition in …

Assorted analytical and spectroscopic techniques for the optimization of the defect-related properties in size-controlled ZnO nanowires

KM Wong, Y Fang, A Devaux, L Wen, J Huang… - Nanoscale, 2011 - pubs.rsc.org
In this article, the important role of the intrinsic defects in size-controlled ZnO nanowires
(NWs) which play a critical role in the properties of the NWs, was studied with a combined …

In situ probing electrical response on bending of ZnO nanowires inside transmission electron microscope

KH Liu, P Gao, Z Xu, XD Bai, EG Wang - Applied Physics Letters, 2008 - pubs.aip.org
In situ electrical transport measurements on individual bent ZnO nanowires have been
performed inside a high-resolution transmission electron microscope, where the crystal …

On the difficulties in characterizing ZnO nanowires

E Schlenker, A Bakin, T Weimann, P Hinze… - …, 2008 - iopscience.iop.org
The electrical properties of single ZnO nanowires grown by vapor phase transport were
investigated. While some samples were contacted by Ti/Au electrodes, another set of …