The power consumption of modern highly complex chips during scan test is significantly
higher than the power consumed during functional mode. This leads to substantial heat …

Test power has been turned to a bottleneck for test considerations as the excessive power
dissipation has serious negative effects on chip reliability. In scan‐based designs, rippling …

Power dissipation in digital systems may be significantly high during scan testing where a
large portion of power is consumed in the combinational part. This paper presents a new …

Excessive switching activity in test mode results in higher power dissipation than normal
mode of operation and becoming a serious issue, in order to avoid reliability problems …

Switching activity is much higher in test mode as compared to normal mode of operation
which causes higher power dissipation, and this leads to several reliability issues. Output …

We present a novel scan architecture for simultaneously reducing test application time and
test power (both average and peak power). Unlike previous works where the scan chain is …

Reduction in test power is important to improve battery lifetime in portable electronic devices
employing periodic self-test, to increase reliability of testing, and to reduce test cost. In scan …

Power consumption of very large scale integrated (VLSI) systems is much higher during
testing as a result of increased circuit activity. This paper presents a novel low-power D flip …

A two-stage scan architecture is proposed to constrain transition propagation within a small
part of scan flip-flops. Most scan flip-flops are deactivated during test application. The first …

In this paper, a new scan flip-flop is proposed for low power testing. Different flip-flops
(Master-slave, hybrid, pulse triggered) are reviewed and evaluated their performance using …