A study of zinc doping in metallo‐organic chemical vapor deposition of InP

AW Nelson, LD Westbrook - Journal of applied physics, 1984 - pubs.aip.org
Over the last ten years the quality of both bulk and epitaxial InP has improved substantially
and the material is now receiving a great deal of attention as its properties are utilized in a …

Photoluminescence and double‐crystal x‐ray study of InGaAs/InP: Effect of mismatch strain on band gap

IC Bassignana, CJ Miner, N Puetz - Journal of applied physics, 1989 - pubs.aip.org
Epitaxial layers of InGaAs on InP are the building blocks in optoelectronic device fabrication,
where the dependence of the band gap on composition is utilized in device design. The …

Determination of In‐Ga‐As phase diagram at 650 °C and LPE growth of lattice‐matched In0.53Ga0.47As on InP

K Nakajima, T Tanahashi, K Akita… - Journal of Applied …, 1979 - pubs.aip.org
The liquidus isotherm in the In‐rich corner of the In‐Ga‐As system at 650° C was
experimentally determined by an improved seed dissolution technique using InP seeds. The …

[引用][C] Phase diagram for LPE growth of GaInAsP layers lattice matched to InP substrates

J Hsieh - IEEE Journal of Quantum Electronics, 1981 - ieeexplore.ieee.org
Phase diagram for LPE growth of GaInAsP layers lattice matched to InP substrates Page 1
118 IEEE JOURNAL OF QUANTUM ELECTRONICS, VOL. QE-17, NO. FEBRUARY 1981 …

Rare-earth elements in the technology of InP, InGaAsP and devices based on these semiconductor compounds

AT Gorelenok, AV Kamanin, NM Shmidt - Microelectronics journal, 1995 - Elsevier
The results are reported of our investigations into the application of rare-earth elements in
the liquid phase epitaxy technology of InP, InGaAsP and devices based on these …

Refractive index of In1−xGaxAsyP1−y layers and InP in the transparent wavelength region

B Broberg, S Lindgren - Journal of Applied Physics, 1984 - pubs.aip.org
We have measured the refractive index of InP and of liquid‐phase‐epitaxy–grown InGaAsP
layers on InP in the transparent wavelength region using a Brewster‐angle method. The …

Lpe highly perfect ingaasp/lnp structure characterization by x-ray double crystal diffractometry

C Bocchi, C Ferrari, P Franzosi, G Fornuto… - Journal of electronic …, 1987 - Springer
X-ray double crystal diffractometry has been used to assess the crystal quality of
InGaAsP/InP single heterostructures grown by liquid phase epitaxy. Diffraction profiles have …

Metalorganic vapor phase epitaxical growth and 1.5‐μm laser fabrication using ethyldimethylindium, tertiarybutylphosphine, and tertiarybutylarsine

M Ogasawara, K Sato, Y Kondo - Applied physics letters, 1992 - pubs.aip.org
High‐quality InGaAsP lattice matched to InP was grown by low‐pressure metalorganic vapor
phase epitaxy using ethyldimethylindium (EDMIn), tertiarybutylphosphine (TBP), and …

Liquid phase epitaxial growth of Fe‐doped semi‐insulating InGaAsP lattice matched to InP over the entire composition range

M Kondo, M Sugawara, T Tanahashi, S Isozumi… - Applied physics …, 1988 - pubs.aip.org
Fe‐doped semi‐insulating In1− x Ga x As y P1− y (0≤ y≤ 1, y= 2.2 x) epitaxial layers lattice
matched to InP with nearly intrinsic carrier concentrations have been successfully grown …

Vapor phase epitaxial growth and characterization of InP on GaAs

SJJ Teng, JM Ballingall, FJ Rosenbaum - Applied physics letters, 1986 - pubs.aip.org
Crystal growth of InP on GaAs by vapor phase epitaxy is reported. It is demonstrated that
good quality InP epitaxial layers with featureless surface morphology can be grown on GaAs …