Current model of fully depleted nanoscale surrounding-gate metal–oxide–semiconductor field-effect transistors with doped channel in all operation regions

BK Choi, MK Jeong, IH Cho, HI Kwon… - Japanese Journal of …, 2009 - iopscience.iop.org
The diffusion current of fully depleted (FD) nanoscale surrounding-gate (SG) metal–oxide–
semiconductor field effect transistors (MOSFETs) with a doped channel was physically …

Threshold Voltage Modeling of Fully Depleted Nanoscale Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors with Doped Channel by Considering …

BK Choi, HI Kwon, IH Cho, JH Lee - Japanese Journal of Applied …, 2009 - iopscience.iop.org
The threshold voltage (V th) was modeled in a simple closed form by considering drain bias
(V DS) for fully depleted (FD) symmetric double-gate (DG) n-channel metal–oxide …

Analytical Modeling and Simulation of Dual-Material Surrounding-Gate Metal–Oxide–Semiconductor Field Effect Transistors with Single-Halo Doping

ZC Li, RZ Zhang, YL Jiang - Japanese Journal of Applied …, 2009 - iopscience.iop.org
We present a modified surrounding-gate metal–oxide–semiconductor field effect transistor
(MOSFET), in which the gate consists of two metals with different work functions, and single …

A unified carrier-transport model for the nanoscale surrounding-gate MOSFET comprising quantum–mechanical effects

G Hu, J Gu, S Hu, Y Ding, R Liu… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
A unified carrier-transport model for a nanoscale surrounding-gate metal-oxide-
semiconductor field-effect transistor (SG MOSFET) is developed. The model is based on …

Analytical threshold model for nanoscale cylindrical surrounding-gate metal–oxide–semiconductor field effect transistor with high-κ gate dielectric and tri-material gate …

C Li, YQ Zhuang, R Han - Japanese Journal of Applied Physics, 2010 - iopscience.iop.org
A novel cylindrical surrounding-gate metal–oxide–semiconductor field effect transistor with
high-κ gate dielectric and tri-material gate stack (TMGCSG MOSFET) is presented. The …

Compact drain-current model for undoped cylindrical surrounding-gate metal-oxide-semiconductor field effect transistors including short channel effects

B Smaani, S Latreche, B Iñiguez - Journal of Applied Physics, 2013 - pubs.aip.org
In this paper, we present a compact model for undoped short-channel cylindrical
surrounding-gate MOSFETs. The drain-current model is expressed as a function of the …

Implicit continuous current–voltage model for surrounding-gate metal–oxide–semiconductor Field-Effect Transistors Including Interface Traps

YS Yu, N Cho, SW Hwang, D Ahn - IEEE transactions on …, 2011 - ieeexplore.ieee.org
An analytic and continuous direct-current model for cylindrical doped surrounding-gate
metal-oxide-semiconductor field-effect transistors (SGMOSFETs) including interface-trap …

A physics-based short-channel current-voltage model for lightly-doped-drain metal-oxide-semiconductor field-effect-transistors

MC Hu, SLJSL Jang… - Japanese journal of …, 1997 - iopscience.iop.org
In this paper we present a new analytical physics-based drain current model for fully
overlapped and partially overlapped lightly-doped-drain metal-oxide-semiconductor field …

Quasi-two-dimensional threshold voltage model for junctionless cylindrical surrounding gate metal-oxide-semiconductor field-effect transistor with dual-material gate

C Li, YQ Zhuang, L Zhang, G Jin - Chinese Physics B, 2013 - iopscience.iop.org
Based on the quasi-two-dimensional (2D) solution of Poisson's equation in two continuous
channel regions, an analytical threshold voltage model for short-channel junctionless dual …

[PDF][PDF] metal-oxide-semiconductor field-effect transistor. II. Continuous drain current model from subthreshold to inversion region

EN Cho, YH Shin, I Yun - JOURNAL OF APPLIED PHYSICS, 2013 - scholar.archive.org
Based on the subthreshold region model described in Paper I [Cho et al., J. Appl. Phys. 113,
214506 (2013)], a continuous drain current model with a variation of channel doping …