Scanning force microscopy has been developed as a practical, non-contact probing
technique for measuring voltage waveforms at internal nodes of integrated devices and …

A scanning force microscope for measuring ultrafast voltage signals is demonstrated. The
new technique is based on mixing due to the square-law force interaction present between …

Although scanning probe microscopy is traditionally limited to slow temporal response,
techniques utilizing nonlinear tip-to-sample interactions can be used to capture very fast …

A new device internal test technique is introduced based on a scanning force microscope
enabling the electrical characterization of integrated circuits with both high spatial and …

This article describes a scanning probe microscopy technique for quantitative high-speed
voltage wave form measurement inside an operating integrated circuit. Internal signals are …

A high-resolution noncontact scanned probe technique has been developed for sampling
the internal signals of an operating integrated circuit. The signal waveform is extracted by …

Picosecond Electrical Sampling Using a Scanning Force Microscope Page 1 Abstract
Picosecond Electrical Sampling Using a Scanning Force Microscope A. S. Hou, F. Ho, and D …

Using a scanning force microscope as a high-speed all-electrical sampler, the authors have
probed voltages on internal nodes of integrated circuits. The authors have demonstrated …

A high-resolution non-contact scanned probe potential measurement technique for
integrated circuits is presented. Local potentials are extracted by sensing the electrostatic …

A scanning force microscope can be used to measure a device's internal electrical potential
with high spatial and temporal resolution. We present experimental results taken with a …