Electrostatic (EFM) and Kelvin probe force microscopy (KPFM) have contributed significantly
to the understanding of nanoscale electronic properties and the structure-property …

Kelvin probe force microscopy (KPFM) has been used for the characterization of metals,
insulators, and semiconducting materials on the nanometer scale. Especially in …

In microelectronics and biology, many fundamental processes involve the exchange of
charges between small objects, such as nanocrystals in photovoltaic blends or individual …

Recently, there have been a number of variations of electrostatic force microscopy (EFM)
that allow for the measurement of time-varying forces arising from phenomena such as ion …

Knowledge on surface potential dynamics is crucial for understanding the performance of
modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin …

Seven years have passed since the first volume “Kelvin probe force microscopy—Measuring
and compensating electrostatic forces” has been published in 2011. It presented the first …

Kelvin probe force spectroscopy (KPFS) and finite-element method (FEM) simulations were
employed to investigate the averaging effect of the work function signals of nanoscale …

Since its invention in 1991, Kelvin Probe Force Microscopy (KPFM) has developed into the
primary tool used to characterize electrical phenomena on the nanometer scale, with …

Studying electrostatic and electronic surface properties such as work function (WF) or local
charge phenomena is of high importance not only in surface physics and chemistry, but also …

This book provides a comprehensive introduction to the methods and variety of Kelvin probe
force microscopy, including technical details. It also offers an overview of the recent …