4H-SiC Schottky barrier diodes using Mo-, Ti-and Ni-based contacts

D Perrone, M Naretto, S Ferrero, L Scaltrito… - Materials Science …, 2009 - Trans Tech Publ
We have studied different Schottky and ohmic contacts on 4H-SiC with the aim to obtain
Schottky barrier diodes (SBDs) capable to operate at high temperatures, frequencies and …

Design, Fabrication and Characterization of 1.5 mΩcm2, 800 V 4H-SiC n-Type Schottky Barrier Diodes

M Furno, F Bonani, G Ghione, S Ferrero… - Materials Science …, 2005 - Trans Tech Publ
We present a theoretical and experimental study on the design, fabrication and
characterization of Schottky Barrier Diodes (SBD) on commercial 4H-SiC epitaxial layers …

Improved Ni Schottky Contacts on n-Type 4H-SiC Using Thermal Processing

TN Oder, TL Sung, M Barlow, JR Williams… - Journal of electronic …, 2009 - Springer
High-temperature processing was used to improve the barrier properties of three sets of n-
type 4H-SiC Schottky diodes fabricated with Ni Schottky contacts. We obtained an optimum …

Barrier height determination for n-type 4H-SiC schottky contacts made using various metals

R Yakimova, C Hemmingsson, MF Macmillan… - Journal of electronic …, 1998 - Springer
We have studied Schottky barrier contacts to n-type 4H-SiC with Cr, Mo, Ta, W, Au, and Ni.
We have focused on effects of the metal work function, measurement technique and …

Ambient temperature characteristics of Schottky contacts on 4H–SiC aged in air at 350° C

AV Adedeji, AC Ahyi, JR Williams, SE Mohney… - Solid-state …, 2010 - Elsevier
A metallization scheme suitable to explore the capability of 4H–SiC for high temperature
applications was designed and fabricated on Schottky barrier diodes (SBDs). The device …

[HTML][HTML] Effects of deposition temperature on the electrical properties of Ti/SiC Schottky barrier diodes

TN Oder, KC Kundeti, N Borucki, SB Isukapati - AIP Advances, 2017 - pubs.aip.org
Ti Schottky contacts were deposited on n-type 4H-SiC at different temperatures ranging from
28 o C to 900 o C using a magnetron sputtering deposition system to fabricate Schottky …

Ideal Ni-based 4H–SiC Schottky barrier diodes with Si intercalation

M Gao, L Fan, Z Chen - Materials Science in Semiconductor Processing, 2020 - Elsevier
Abstract The Ni-based 4H–SiC Schottky barrier diodes (SBDs) with Si intercalation have
been investigated. The electrical properties of SBDs are characterized by temperature …

Effect of surface preparation and thermal anneal on electrical characteristics of 4H-SiC Schottky barrier diodes

D Alok, R Egloff, E Arnold - Materials Science Forum, 1998 - osti.gov
The effect of surface preparation and thermal anneal on electrical characteristics of 4H-SiC
Schottky barrier diodes was investigated with the aim of finding a suitable fabrication …

Electrical analysis and interface states evaluation of Ni Schottky diodes on 4H‐SiC thick epilayers

S Porro, RR Ciechonski, M Syväjärvi… - physica status solidi …, 2005 - Wiley Online Library
This work has been focused on characterization of thick 4H‐SiC layers produced by
sublimation epitaxy. Nickel Schottky contacts have been fabricated in order to characterize …

Fabrication of 1.2 kV, 100A, 4H-SiC (0001) and (000-1) junction barrier Schottky diodes with almost same Schottky barrier height

A Kinoshita, T Ohyanagi, T Yatsuo… - Materials Science …, 2010 - Trans Tech Publ
It is known that a Schottky barrier height ( b) of metal/C-face 4H-SiC Schottky barrier diode
(SBD) differ from b of metal/Si-face 4H-SiC SBD. Furthermore, b of metal/4H-SiC SBD …