With decreasing feature size, analysis of circuits for radiation strike vulnerability is becoming
very important in a many applications. Classical modeling methods may be not sufficient to …

The single event transients (SETs) are a common source of malfunction in nano-scale
CMOS integrated circuits. For this reason, evaluation of the SET effects and application of …

An accurate and computer efficient analytical model for the evaluation of integrated circuit
sensitivity to radiation induced single event transients is presented. The key idea of the work …

As the demand for complex functions to be performed in harsh environments such as space
applications converges with continually diminishing IC feature sizes, the traditional methods …

As integrated circuits become smaller and more complex, it has become increasingly difficult
to simulate their responses to radiation. The distance and time scales of relevance extend …

Digital single event transients (DSETs) are becoming an increasing concern for deep
submicron ICs. As device feature sizes shrink, digital circuits become faster, have smaller …

As technology feature sizes decrease, single event upset (SEU), digital single event
transient (DSET), and multiple bit upset (MBU) effects dominate the radiation response of …

This paper presents an efficient and accurate numerical analysis technique to simulate
single event upsets (SEUs) in logic circuits. Experimental results that show the method is …

Radiation effects, like Single Event Transients (SET), are increasingly affecting integrated
circuits as device dimensions are scaling down. With decreasing dimensions and supply …

In recent times, dynamic supply voltage scaling (DVS) has been extensively employed to
minimize the power and energy of VLSI systems. Also, sub-threshold circuits are becoming …