This paper proposes a low power scan test scheme and formulates a problem based on this
scheme. In this scheme the flip-flops are grouped into N scan chains. At any time, only one …

Latest VLSI circuits face the problem of power dissipation not only in design phase but also
during testing phase. Power dissipation during testing may be increased up to three times …

Power consumption in scan based testing is high due to the toggling of the combinational
logic during the scan shift. In this paper, we present a modified Scan Flip-flop architecture …

This paper addresses the issue of blocking pattern selection to reduce both leakage and
peak power consumption during circuit testing using scan-based approach. The blocking …

Excessive switching activity in test mode results in higher power dissipation than normal
mode of operation and becoming a serious issue, in order to avoid reliability problems …

Power consumption in test becomes a higher barrier for consideration in test of any
combinational circuit is high during test mode as in its normal mode of functioning as …

Power consumption during testing is becoming a primary concern. In this paper, an
adjustable clock scan structure is presented. It can significantly reduce the peak power …

A new scan partition architecture to reduce both the average and peak power dissipation
during scan testing is proposed for low‐power embedded systems. In scan‐based testing …

Scan design, providing a good test solution to sequential circuits, suffers large data volume,
long test time and high test power problem. Recently, the random access scan (RAS) …

Power dissipated during test application is substantially higher than power dissipated during
functional operation [22] which can decrease the reliability and lead to yield loss. This paper …