An Improvement of Analytical I–V Model for Surrounding-Gate MOSFETs

A Alkoash, RM Šašć, SM Ostojić… - … of Computational and …, 2011 - ingentaconnect.com
The paper presents a realistic and necessary improvement of the existing current–voltage
model for surrounding-gate MOSFETs. The basic model exploits the closed-form solution of …

A unified carrier-transport model for the nanoscale surrounding-gate MOSFET comprising quantum–mechanical effects

G Hu, J Gu, S Hu, Y Ding, R Liu… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
A unified carrier-transport model for a nanoscale surrounding-gate metal-oxide-
semiconductor field-effect transistor (SG MOSFET) is developed. The model is based on …

Analytical Parametric Modeling of Nanoscale Surrounding Gate MOSFET Based on the Poisson's Equation

PK Singh, S Sharma - Journal of Computational and Theoretical …, 2013 - ingentaconnect.com
In this paper lightly doped surrounding gate (SGT) MOSFET, which is based on the exact
solution of the Poisson's equation, and the current continuity equation without the charge …

A simple model for the nanoscale surrounding-gate MOSFET

D Jimenez, B Iñíguez, JJ Saenz, J Sune… - … (IEEE Cat. No …, 2004 - ieeexplore.ieee.org
A simple model for the nanoscale surrounding-gate MOSFET Page 1 PROC. 24th
INTERNATIONAL CONFERENCE ON MICROELECTRONICS (MIEL 2004). VOL 1, Nls …

An accurate model of inversion carrier effective mobility considering scattering mechanisms for nanoscale mos devices

EJZM Sathi, QDM Khosru - International Conference on …, 2010 - ieeexplore.ieee.org
Electrical characteristics of metal oxide-semiconductor field effect transistor (MOSFET) are
numerically studied here. Carriers scattering in the inversion channel of MOSFET dominates …

A New Threshold Voltage and Drain Current Model for Lightly/Heavily Doped Surrounding Gate MOSFETs

P Dutta, B Syamal, K Koley… - Journal of …, 2015 - ingentaconnect.com
In this paper, we have presented a surface potential based drain current and threshold
voltage model for surrounding gate MOSFETs that is valid for all doping concentrations. The …

An analytic potential-based model for undoped nanoscale surrounding-gate MOSFETs

W Bian, J He, Y Tao, M Fang… - IEEE transactions on …, 2007 - ieeexplore.ieee.org
An analytic potential-based model for the undoped surrounding-gate MOSFETs is derived in
the paper. The model is obtained from rigorously solving Poisson equation together with the …

Modeling of parameters for nano‐scale surrounding‐gate MOSFET considering quantum mechanical effect

M Chanda, S De, CK Sarkar - International Journal of …, 2014 - Wiley Online Library
In this paper, an analytical surface potential and threshold voltage model for surrounding
gate metal‐oxide semiconductor field‐effect transistor are proposed considering the …

A carrier-based analytic drain current model incorporating velocity saturation for undoped surrounding-gate MOSFETs

L Zhang, Y Guan, W Zhou, L Chen… - … science and technology, 2009 - iopscience.iop.org
A carrier-based analytic drain current model including the velocity saturation effect for the
undoped surrounding-gate (SRG) MOSFETs is developed in this paper. Based on the …

A physics-based short-channel current–voltage model for buried-channel MOSFETs

CG Chyau, SL Jang - Solid-State Electronics, 1999 - Elsevier
In this paper, we present a physics-based and analytical I–V model for submicron buried-
channel MOSFETs. The model is based on the quasi 2D Poisson equation and includes the …