Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …

Arm CPU architectures, thanks to their efficiency and flexibility, have been widely adopted in
portable user devices such as smartphones, tablets, and laptops. Recently, the high …

Fault injection in early microarchitecture-level simulation CPU models and beam
experiments on the final physical CPU chip are two established methodologies to access the …

Full chip statistical fault injection has been performed on a hardware emulated POWER6
platform. These results were validated against proton beam injection results. The fault …

The effects of soft errors in processor cores have been widely studied. However, little has
been published about soft errors in uncore components, such as memory subsystem and I/O …

Cross-layer reliability is becoming the preferred solution when reliability is a concern in the
design of a microprocessor-based system. Nevertheless, deciding how to distribute the error …

Fault injection on micro architectural structures modeled in performance simulators is an
effective method for the assessment of microprocessors reliability in early design stages …

Early reliability assessment of hardware structures using microarchitecture level simulators
can effectively guide major error protection decisions in microprocessor design. Statistical …

Technology constraints and application characteristics are radically changing as we scale to
the end of silicon technology. Devices are becoming increasingly brittle, highly varying in …

What is the probability that the execution state of a given microprocessor running a given
application is correct, in a certain working environment with a given soft-error rate? Trying to …