RP Lu, KL Kavanagh, SJ Dixon-Warren… - Journal of Vacuum …, 2001 - pubs.aip.org
… The emergence of scanning spreading resistancemicroscopy (… atomic-force microscope (AFM) scanning in contact mode, … The variation in the current, as the tip is scanned, should …
D Ban, EH Sargent, SJ Dixon-Warren… - Journal of Vacuum …, 2002 - pubs.aip.org
… a scanning spreading resistancemicroscopy (SSRM) and scanning capacitance microscopy … Calibrated SSRM and SCM measurements were performed on the MQW BH laser structure, …
L Wang, JM Chauveau, R Brenier, V Sallet… - Applied Physics …, 2016 - pubs.aip.org
… (c) for calibration purpose. The two horizontal lines indicate the range of SSRM resistance for MOCVD grown ZnO NWs in this work. Their intersections with the calibration curve indicate …
… We present a procedure for calibrated complex impedance measurements and dielectric quantification with scanning microwave microscopy. The calibration procedure works in situ …
P Eyben, D Alvarez, T Clarysse, S Denis… - AIP Conference …, 2003 - pubs.aip.org
… and have been calibrated with the Spreading Resistance Probe … large dimensions of the present calibration structures, efforts are … of scanning for the collection of a full calibration curve. …
… regime of the calibration curve, one notices a saturation of the resistance (Figure 3). To understand this effect, one needs to realize that SSRM measures the total resistance between tip …
… In this work, we calibrate a thermo-resistive SThM probe … scanning the metal lines is also evaluated under different probe and line temperatures. Our results reveal that the calibration …
RS Dhar, D Ban - Journal of Microscopy, 2013 - Wiley Online Library
… (SSRM) and scanning capacitance microscopy (SCM). … -barrier structure were calibrated utilizing known GaAs dopant … our results the efficacy of uniting calibrated SSRM and SCM to …
M Matsui, T Odaka, H Nagaishi… - Journal of Micro …, 2010 - spiedigitallibrary.org
… defect resistance, which is quantitatively estimated from the voltage contrast formed in a scanning electron microscopy (… calibration wafers for the voltage-contrast calibration. The contact …