A universal scheme for robust self-testing in the prepare-and-measure scenario

N Miklin, M Oszmaniec - Quantum, 2021 - quantum-journal.org
… To this aim, we propose a universal and intuitive scheme based on establishing perfect …
Finally, we prove that for qubits, our technique can be used to robustly self-test arbitrary …

A built-in-self-test scheme for online evaluation of physical unclonable functions and true random number generators

SU Hussain, M Majzoobi… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
… the Built-In-Self-Test (BIST) scheme: stability and unpredictability. … To demonstrate this
Built-In-Self-Test scheme we analyze the … While these tests are important, complete security of the …

A complete scheme of built-in self-tests (BIST) structure for fault diagnosis in analog circuits and systems

AA Hatzopoulos, S Siskos… - IEEE transactions on …, 1993 - ieeexplore.ieee.org
… a complete BIST scheme is proposed. This scheme may be included in any analog or mixed
analog-digital circuit and may check its responses by following selected testing procedures. …

A totally self-checking checker for a parallel unordered coding scheme

SW Burns, NK Jha - IEEE transactions on computers, 1994 - ieeexplore.ieee.org
… enable the r-variable TRC to be made self-testing with only four codewords 1191. Thus, our
complete checker would be shown to be self-testing with a very small number of codewords. …

Oscillation built-in self test (OBIST) scheme for functional and structural testing of analog and mixed-signal integrated circuits

K Arabi, B Kaminska - Proceedings International Test …, 1997 - ieeexplore.ieee.org
… built-in self test (BIST) technique suitable for both functional and structural testing of analog
… Developing a complete and practical test solution for ADCs is our second objective. Many …

A hybrid built-in self-test scheme for DRAMs

CC Yang, JF Li, YC Yu, KT Wu, CY Lo… - … Automation and Test …, 2015 - ieeexplore.ieee.org
test application of the first test algorithm is completed when a … BIST scheme can support the
infield programmability of test … to support the programmability of test parameter, the number of …

A transparent built-in self-test scheme for detecting single V-coupling faults in RAMs

BF Cockburn, YFN Sat - … Memory Technology, Design, and Test, 1994 - ieeexplore.ieee.org
… Abstract: This paper describes a transparent built-in selftest (BIST) scheme for random-…
completed. Nicolaidis’ method requires that a proposed RAM selftest be first transformed in a …

A low-cost built-in self-test scheme for an array of memories

YJ Huang, CW Chou, JF Li - 2010 15th IEEE European Test …, 2010 - ieeexplore.ieee.org
… long testing time, the BIST scheme tests multiple identical memories in a pipeline and each
memory with a serial test … operations are used for waiting the last memory to complete the test

An efficient on-line-test and back-up scheme for embedded processors

M Pflanz, F Pompsch… - International Test …, 1999 - ieeexplore.ieee.org
… Techniques of synthesis of the complete data path @P) for self-testability have been … of such
a scheme under realistic constraints. First, we discuss self-test strategies for control path and …

A scheme for built-in self test of a digital integrator

MA Kassab - 1993 - escholarship.mcgill.ca
… Des simulations de type Monte-Carlo sont utilisés pour démontrer la couvert.ure complete
des tests pour tous les défauts possible de l'int(~grateur une fois que les lIlodifications aient …