… testing is considered. In this paper, we present a survey of the low power testing techniques
that can be used to test VLSI … increased power consumed during functional testing of a circuit…

… on low power testing and various parameters responsible for excess power consumption.
It also … certain techniques for reducing the power consumption during the testing of circuits. …

… problem of testing low power VLSI circuits within the general context of the VLSI design flow…
Section 1.2 overviews the VLSI design flow and outlines the importance of testing integrated …

… automated test equipment (ATE) usually contains classy test hardware and inquisitive solutions
for the conservative factory test of VLSI circuits. This makes a device spends on the tester …

… application time, test efficiency, or performance. The second part of this dissertation addresses
power minimisation techniques for testing low power VLSI circuits using built-in self-test (…

… test of complex digital circuits imposes extreme challenges to current tools and methodologies.
VLSI circuit … Test currently ranks among the most expensive and problematic aspects in a …

… Accurate analysis, sophisticated design, and effective test methods are the requirement
to ensure the proper functionality and reliability of VLSI circuits. The testing of interconnect is …

… In summary, increased VLSI circuit size and the presence of sequential circuits places
limitations on how test vectors can be automatically generated and how these same circuits may …

… In this paper we demonstrate our statistical simulation methodology for a VLSI analog circuit.
… to optimize the test set for this circuit, by showing that the frequency response tests at many …

… testing is a method for testing VLSI circuits by detecting elevated levels of quiescent current
caused by defects in the circuit [… As applied today, iDDQ is measured on a set of test vectors …