Non-contact lateral force microscopy
Journal of Physics: Condensed Matter, 2017 - iopscience.iop.org
The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long-range forces …
between the tip and the surface. The signal recorded, however, includes long-range forces …
Non-contact lateral force microscopy
AJ Weymouth - Journal of Physics Condensed Matter, 2017 - ui.adsabs.harvard.edu
The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long-range forces …
between the tip and the surface. The signal recorded, however, includes long-range forces …
Non-contact lateral force microscopy
AJ Weymouth - Journal of physics. Condensed matter: an …, 2017 - pubmed.ncbi.nlm.nih.gov
The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long-range forces …
between the tip and the surface. The signal recorded, however, includes long-range forces …
Non-contact lateral force microscopy.
AJ Weymouth - Journal of physics. Condensed Matter: an Institute of …, 2017 - europepmc.org
The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long-range forces …
between the tip and the surface. The signal recorded, however, includes long-range forces …
Non-contact lateral force microscopy
AJ Weymouth - Journal of Physics: Condensed Matter, 2017 - epub.uni-regensburg.de
The goal of atomic force microscopy (AFM) is to measure the short-range forces that act
between the tip and the surface. The signal recorded, however, includes long range forces …
between the tip and the surface. The signal recorded, however, includes long range forces …
[引用][C] Non-contact lateral force microscopy
AJ Weymouth - Journal of Physics: Condensed Matter, 2017 - cir.nii.ac.jp
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