An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

CJ Tourek, S Sundararajan - Review of Scientific Instruments, 2010 - pubs.aip.org
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …
被引用次数：15 相关文章

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

CJ Tourek, S Sundararajan - The Review of scientific …, 2010 - pubmed.ncbi.nlm.nih.gov
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

CJ Tourek, S Sundararajan - Review of Scientific Instruments, 2010 - hero.epa.gov
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

CJ Tourek, S Sundararajan - Review of Scientific Instruments, 2010 - pubs.aip.org
Since its invention in the early 1980s the atomic force microscope (AFM) has become one of
the most powerful tools in the fields of nanoscience and nanotechnology for the preparation …

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

CJ Tourek, S Sundararajan - Review of Scientific …, 2010 - ui.adsabs.harvard.edu
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …
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[PDF][PDF] AN ALTERNATIVE METHOD TO DETERMINING OPTICAL LEVER SENSITIVITY IN ATOMIC FORCE MICROSCOPY WITHOUT TIP-SAMPLE CONTACT

CJ Tourek, S Sundararajan - Application of atom probe tomography to the …, 2012 - Citeseer
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

AN ALTERNATIVE METHOD TO DETERMINING OPTICAL LEVER SENSITIVITY IN ATOMIC FORCE MICROSCOPY WITHOUT TIP-SAMPLE CONTACT

CJ Tourek, S Sundararajan - … TO ALL USERS The quality of …, 2012 - search.proquest.com
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact.

CJ Tourek, S Sundararajan - The Review of Scientific Instruments, 2010 - europepmc.org
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

AN ALTERNATIVE METHOD TO DETERMINING OPTICAL LEVER SENSITIVITY IN ATOMIC FORCE MICROSCOPY WITHOUT TIP-SAMPLE CONTACT

CJ Tourek, S Sundararajan - … TO ALL USERS The quality of …, 2012 - search.proquest.com
Force studies using atomic force microscopy generally require knowledge of the cantilever
spring constants and the optical lever sensitivity. The traditional method of evaluating the …

[引用][C] An alternative method to determining optical lever sensitivity in atomic force microscopy without tip-sample contact

C Tourek, S Sundararajan - 2010