Inner-paddled atomic force microscopy cantilever for rapid mechanical mapping

X Yang, C Ma, X Wang, C Zhou - Sensors and Actuators A: Physical, 2023 - Elsevier
Mechanical characterization methods at the nanoscale are of critical importance for many
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …
被引用次数：2 相关文章

Inner-paddled atomic force microscopy cantilever for rapid mechanical mapping

X Yang, C Ma, X Wang, C Zhou - Sensors and Actuators A …, 2023 - ui.adsabs.harvard.edu
Mechanical characterization methods at the nanoscale are of critical importance for many
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …
[PDF] researchgate.net

[PDF][PDF] Inner-Paddled Atomic Force Microscopy Cantilever for Rapid Mechanical Mapping

X Yang, C Ma, X Wang, C Zhou - researchgate.net
Mechanical characterization methods at the nanoscale are of critical importance for many
fields including nanomaterials, micro/nano devices and nanomechanics. As a key tool in …

[引用][C] Inner-Paddled Atomic Force Microscopy Cantilever for Rapid Mechanical Mapping

X Yang, C Ma, X Wang, C Zhou