The THELMA model of the joint resistance distribution tests with JORDI

F Bellina, P Bruzzone - IEEE transactions on applied …, 2008 - ieeexplore.ieee.org
In a cable-in-conduit conductor (CICC) operating in DC mode, an uneven current distribution
can be present, due to the non-uniform contact resistance between the individual strands …

[引用][C] The THELMA model of the Joint resistance distribution tests with JORDI

F Bellina, P Bruzzone - IEEE TRANSACTIONS ON APPLIED …, 2008 - air.uniud.it
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[引用][C] The THELMA Model of the joint resistancd distribution tests with JORDI

B Fabrizo - IEEE Trans. Appl. Supercond., 2008 - cir.nii.ac.jp
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[引用][C] The THELMA model of the joint resistance distribution tests with JORDI

F Bellina, P Bruzzone - IEEE Transactions on Applied …, 2008 - infoscience.epfl.ch
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The THELMA Model of the Joint Resistance Distribution Tests with JORDI

F Bellina, P Bruzzone - IEEE Transactions on Applied Superconductivity, 2008 - infona.pl
In a cable-in-conduit conductor (CICC) operating in DC mode, an uneven current distribution
can be present, due to the non-uniform contact resistance between the individual strands …

[引用][C] The THELMA Model of the Joint Resistance Distribution Tests with JORDI

F Bellina, P Bruzzone - IEEE Transactions on Applied …, 2008 - ui.adsabs.harvard.edu
The THELMA Model of the Joint Resistance Distribution Tests with JORDI - NASA/ADS Now
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[引用][C] The THELMA model of the Joint resistance distribution tests with JORDI

F BELLINA, P BRUZZONE - 2008 - ricerca.unityfvg.it

[引用][C] The THELMA Model of the Joint Resistance Distribution Tests with JORDI

F BELLINA, P BRUZZONE - IEEE transactions on applied …, 2008 - pascal-francis.inist.fr
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[引用][C] The THELMA Model of the Joint Resistancd Distribution Tests with JORDI

B Fabrizo - IEEE Transactions on Applied Superconductivity, 2008 - cir.nii.ac.jp
The THELMA Model of the Joint Resistancd Distribution Tests with JORDI | CiNii Research
CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …

[引用][C] The THELMA Model of the Joint Resistance Distribution Tests with JORDI

F BELLINA, P BRUZZONE - IEEE …, 2008 - Institute of Electrical and Electronics …