Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - pubs.aip.org
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …
被引用次数：20 相关文章

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - pubs.aip.org
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - ui.adsabs.harvard.edu
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - cir.nii.ac.jp
抄録< jats: p> This paper presents a method and cantilever design for improving the
mechanical measurement sensitivity in the atomic force microscopy (AFM) tapping mode …
[PDF] archive.org

[PDF][PDF] Bi-Harmonic Cantilever Design for Improved Measurement Sensitivity in Tapping-Mode Atomic Force Microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - scholar.archive.org
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …
[PDF] core.ac.uk

[PDF][PDF] Bi-Harmonic Cantilever Design for Improved Measurement Sensitivity in Tapping-Mode Atomic Force Microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - core.ac.uk
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - The Review of scientific …, 2014 - pubmed.ncbi.nlm.nih.gov
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan - Review of Scientific Instruments, 2014 - osti.gov
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …

Bi-harmonic cantilever design for improved measurement sensitivity in tapping-mode atomic force microscopy

M Loganathan, DA Bristow - Review of Scientific Instruments, 2014 - inis.iaea.org
[en] This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …
[PDF] mst.edu

[PDF][PDF] Bi-Harmonic Cantilever Design for Improved Measurement Sensitivity in Tapping-Mode Atomic Force Microscopy

M Loganathan, DA Bristow - 2014 - scholarsmine.mst.edu
This paper presents a method and cantilever design for improving the mechanical
measurement sensitivity in the atomic force microscopy (AFM) tapping mode. The method …