Noise in optical measurements of cantilever deflections

A Garcı́a-Valenzuela, J Villatoro - Journal of Applied Physics, 1998 - pubs.aip.org
The optical beam deflection method using the knife edge detection technique is one of the
simplest optical sensing methods. We investigate theoretically the limit to the resolution …

Noise in optical measurements of cantilever deflections

A García-Valenzuela, J Villatoro - Journal of Applied Physics, 1998 - ui.adsabs.harvard.edu
The optical beam deflection method using the knife edge detection technique is one of the
simplest optical sensing methods. We investigate theoretically the limit to the resolution …

Noise in optical measurements of cantilever deflections

A Garcı́a-Valenzuela, J Villatoro - Journal of Applied Physics, 1998 - pubs.aip.org
Many different sensors can be devised with the basic configuration of an atomic force
microscope AFM. This may include, monitoring the bending, shift in resonance frequency, or …

[引用][C] NOISE IN OPTICAL MEASUREMENTS OF CANTILEVER DEFLECTIONS

A GARCIA-VALENZUELA… - Journal of applied …, 1998 - American Institute of Physics