CMOS 65 nm wideband LNA reliability estimation

PM Ferreira, H Petit, JF Naviner - 2009 Joint IEEE North-East …, 2009 - ieeexplore.ieee.org
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …
被引用次数：12 相关文章

CMOS 65 nm wideband LNA reliability estimation

PM Ferreira, H Petit, JF Naviner - 2009 Joint IEEE North-East Workshop on … - infona.pl
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …
[PDF] centralesupelec.fr

[PDF][PDF] CMOS 65 nm Wideband LNA Reliability Estimation

PM Ferreira, H Petit, JF Naviner - mysite.centralesupelec.fr
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …
[PDF] hal.science

[PDF][PDF] CMOS 65 nm wideband LNA reliability estimation

PM Ferreira, H Petit, JF Naviner - IEEE New Circuits ans Systems …, 2009 - hal.science
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …
[PDF] academia.edu

[PDF][PDF] CMOS 65 nm Wideband LNA Reliability Estimation

PM Ferreira, H Petit, JF Naviner - academia.edu
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …
[PDF] hal.science

[PDF][PDF] CMOS 65 nm Wideband LNA Reliability Estimation

PM Ferreira, H Petit, JF Naviner - hal.science
Radio frequency (RF) products are very demanding in terms of technology developments.
Reliability will be one of the most important challenges for the semiconductor industry during …