Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - Review of Scientific Instruments, 2007 - pubs.aip.org
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …
被引用次数：69 相关文章

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - arXiv preprint arXiv:0709.0533, 2007 - arxiv.org
Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - Review of Scientific Instruments, 2007 - pubs.aip.org
Tapping-mode atomic force microscopy (AFM) has enabled practical imaging of materials
with nanoscale lateral resolution. 1, 2 In this operation mode the force sensing cantilever …
[PDF] kanazawa-u.ac.jp

[PDF][PDF] Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - REVIEW OF SCIENTIFIC INSTRUMENTS, 2007 - biophys.w3.kanazawa-u.ac.jp
Tapping-mode atomic force microscopy (AFM) has enabled practical imaging of materials
with nanoscale lateral resolution. 1, 2 In this operation mode the force sensing cantilever …

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - Review of Scientific Instruments, 2007 - ui.adsabs.harvard.edu
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.

O Sahin - The Review of Scientific Instruments, 2007 - europepmc.org
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …

[引用][C] Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - Review of Scientific Instruments, 2007 - cir.nii.ac.jp
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying
tip-sample force measurements | CiNii Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ …
[PDF] academia.edu

[PDF][PDF] Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - academia.edu
Tapping-mode atomic force microscopy (AFM) has enabled practical imaging of materials
with nanoscale lateral resolution 1, 2. In this operation mode the force sensing cantilever …

Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - The Review of scientific instruments, 2007 - pubmed.ncbi.nlm.nih.gov
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in
tapping-mode atomic force microscopy. Accuracy of these force measurements is important …
[PDF] archive.org

[PDF][PDF] Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

O Sahin - REVIEW OF SCIENTIFIC INSTRUMENTS, 2007 - scholar.archive.org
Tapping-mode atomic force microscopy (AFM) has enabled practical imaging of materials
with nanoscale lateral resolution. 1, 2 In this operation mode the force sensing cantilever …