Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

E Arima, H Wen, Y Naitoh, YJ Li… - Review of Scientific …, 2016 - pubs.aip.org
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …
被引用次数：20 相关文章

Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces.

E Arima, H Wen, Y Naitoh, YJ Li… - The Review of Scientific …, 2016 - europepmc.org
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …
[PDF] researchgate.net

[PDF][PDF] Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical …

E Arima, H Wen, Y Naitoh, YJ Li… - REVIEW OF SCIENTIFIC …, 2016 - researchgate.net
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

E Arima, H Wen, Y Naitoh, YJ Li… - Review of Scientific …, 2016 - pubs.aip.org
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

E Arima, H Wen, Y Naitoh, YJ Li… - Review of Scientific …, 2016 - ui.adsabs.harvard.edu
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …

[引用][C] Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical …

E Arima, H Wen, Y Naitoh, YJ Li… - Review of Scientific …, 2016 - cir.nii.ac.jp
Development of low temperature atomic force microscopy with an optical beam deflection
system capable of simultaneously detecting the lateral and vertical forces | CiNii Research CiNii …

Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces

E Arima, H Wen, Y Naitoh, YJ Li… - The Review of …, 2016 - pubmed.ncbi.nlm.nih.gov
The atomic force microscopy (AFM) is a very important tool for imaging and investigating the
complex force interactions on sample surfaces with high spatial resolution. In the AFM, two …