[HTML] beilstein-journals.org

[HTML][HTML] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara… - Beilstein journal of …, 2015 - beilstein-journals.org
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
被引用次数：15 相关文章
[HTML] nih.gov

[HTML][HTML] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara… - Beilstein Journal of …, 2015 - ncbi.nlm.nih.gov
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[PDF] semanticscholar.org

[PDF][PDF] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara, L Aeschimann, P Grütter - 2015 - pdfs.semanticscholar.org
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[PDF] mcgill.ca

[PDF][PDF] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara, L Aeschimann, P Grütter - 2015 - physics.mcgill.ca
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[HTML] beilstein-journals.org

[HTML][HTML] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara… - Beilstein Journal of …, 2015 - beilstein-journals.org
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …

Improved atomic force microscopy cantilever performance by partial reflective coating.

Z Schumacher, Y Miyahara, L Aeschimann… - Beilstein Journal of …, 2015 - europepmc.org
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …

Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara… - Beilstein journal of …, 2015 - pubmed.ncbi.nlm.nih.gov
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[PDF] academia.edu

[PDF][PDF] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara, L Aeschimann, P Grütter - 2015 - academia.edu
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[PDF] researchgate.net

[PDF][PDF] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara, L Aeschimann, P Grütter - 2015 - researchgate.net
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …
[PDF] academia.edu

[PDF][PDF] Improved atomic force microscopy cantilever performance by partial reflective coating

Z Schumacher, Y Miyahara, L Aeschimann, P Grütter - 2015 - academia.edu
Optical beam deflection systems are widely used in cantilever based atomic force
microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the …