AFM tip characterization by using FFT filtered images of step structures

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy, 2016 - Elsevier
The measurement resolution of an atomic force microscope (AFM) is largely dependent on
the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the …
被引用次数：12 相关文章

AFM tip characterization by using FFT filtered images of step structures

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy (Amsterdam), 2016 - inis.iaea.org
[en] The measurement resolution of an atomic force microscope (AFM) is largely dependent
on the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties …

AFM tip characterization by using FFT filtered images of step structures

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy, 2016 - infona.pl
The measurement resolution of an atomic force microscope (AFM) is largely dependent on
the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the …

AFM tip characterization by using FFT filtered images of step structures.

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy, 2015 - europepmc.org
The measurement resolution of an atomic force microscope (AFM) is largely dependent on
the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the …
[PDF] researchgate.net

[PDF][PDF] AFM tip characterization by using FFT filtered images of step structures

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy, 2016 - researchgate.net
abstract The measurement resolution of an atomic force microscope (AFM) is largely
dependent on the radius of the tip. Meanwhile, when using AFM to study nanoscale surface …

AFM tip characterization by using FFT filtered images of step structures

Y Yan, B Xue, Z Hu, X Zhao - Ultramicroscopy, 2016 - pubmed.ncbi.nlm.nih.gov
The measurement resolution of an atomic force microscope (AFM) is largely dependent on
the radius of the tip. Meanwhile, when using AFM to study nanoscale surface properties, the …