SG PARK, BJUN JIN, U CHUNG… - IEEE International …, 2004 - pascal-francis.inist.fr
Implementation of HfSiON gate dielectric for sub-60nm DRAM dual gate oxide with recess channel array transistor(RCAT) and tungsten gate CNRS Inist Pascal-Francis CNRS Pascal …
SG PARK - IEDM Tech. Dig., 2004, 2004 - cir.nii.ac.jp
Implementation of HfSiON gate for sub-60nm DRAM dual gate oxide recess channel array transistor (RCAT) and Tungsten gate | CiNii Research CiNii 国立情報学研究所 学術情報 …
SG PARK - IEDM Tech. Dig., 2004, 2004 - cir.nii.ac.jp
Implementation of HfSiON gate for sub-60nm DRAM dual gate oxide recess channel array transistor (RCAT) and Tungsten gate | CiNii Research CiNii 国立情報学研究所 学術情報 …
[引用][C]Implementation of HfSiON gate dielectric for sub-60nm DRAM dual gate oxide with recess channel array transistor (RCAT) and tungsten gate
SG PARK, BJUN JIN, HYELAN LEE, HBAE PARK… - … Electron Devices Meeting, 2004