Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinke, JM Poate, DC Jacobson… - Physical review B, 1991 - APS
Thick amorphous Si layers have been prepared by MeV self-ion-implantation and the
thermodynamic and structural properties examined by calorimetry, Raman-spectroscopy …
被引用次数：491 相关文章

[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon.

S Roorda, WC Sinke, JM Poate… - Physical review. B …, 1991 - europepmc.org
Structural relaxation and defect annihilation in pure amorphous silicon. - Abstract - Europe
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[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S ROORDA, WC SINKE, JM POATE… - Physical review. B …, 1991 - pascal-francis.inist.fr
Structural relaxation and defect annihilation in pure amorphous silicon CNRS Inist Pascal-Francis
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Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinke, JM Poate… - Physical …, 1991 - ui.adsabs.harvard.edu
Thick amorphous Si layers have been prepared by MeV self-ion-implantation and the
thermodynamic and structural properties examined by calorimetry, Raman-spectroscopy …

[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinke, JM Poate, DC Jacobson… - Physical Review …, 1991 - cir.nii.ac.jp
Structural relaxation and defect annihilation in pure amorphous silicon | CiNii Research CiNii
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[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinke, JM Poate… - Physical review. B …, 1991 - pubmed.ncbi.nlm.nih.gov

[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S ROORDA, WC SINKE, JM POATE… - Physical review. B …, 1991 - American Physical Society

[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC Sinkelr, F Spaepen - PHYSICAL REVIEW B

[引用][C] Structural relaxation and defect annihilation in pure amorphous silicon

S Roorda, WC SinkeJr - PHYSICAL REVIEW B