[HTML][HTML] Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system
W Sun, J Qian, Y Li, Y Chen, Z Dou… - Beilstein Journal of …, 2024 - beilstein-journals.org
Multifrequency atomic force microscopy (AFM) utilizes the multimode operation of
cantilevers to achieve rapid high-resolution imaging and extract multiple properties …
cantilevers to achieve rapid high-resolution imaging and extract multiple properties …
[HTML][HTML] Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system
W Sun, J Qian, Y Li, Y Chen, Z Dou, R Lin, P Cheng… - beilstein-journals.org
beam. They are shown in Figure 1a. The Bode plots of the non-contact tip–sample
interaction [12] and the contact tip–sample interaction [23] can be obtained through transfer …
interaction [12] and the contact tip–sample interaction [23] can be obtained through transfer …