Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger, U Sivan - Review of Scientific Instruments, 2015 - pubs.aip.org
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …
被引用次数：7 相关文章

Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger… - The Review of scientific …, 2015 - pubmed.ncbi.nlm.nih.gov
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger… - Review of Scientific …, 2015 - ui.adsabs.harvard.edu
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Autopilot for frequency-modulation atomic force microscopy.

K Kuchuk, I Schlesinger, U Sivan - The Review of Scientific …, 2015 - europepmc.org
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger, U Sivan - Review of Scientific Instruments, 2015 - inis.iaea.org
[en] One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger, U Sivan - Review of Scientific Instruments, 2015 - pubs.aip.org
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …

Autopilot for frequency-modulation atomic force microscopy

K Kuchuk, I Schlesinger, U Sivan - Review of Scientific Instruments, 2015 - osti.gov
One of the most challenging aspects of operating an atomic force microscope (AFM) is
finding optimal feedback parameters. This statement applies particularly to frequency …