Atomic force microscopy cantilevers for sensitive lateral force detection

M Kageshima, H Ogiso, S Nakano… - Japanese journal of …, 1999 - iopscience.iop.org
In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …
被引用次数：23 相关文章

[引用][C] Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection.

M Kageshima, H Ogiso, S Nakano, MA Lantz… - Japanese Journal of …, 1999 - jlc.jst.go.jp
In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …

Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

M Kageshima, H Ogiso, S Nakano… - Japanese Journal of …, 1999 - ui.adsabs.harvard.edu
In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …

Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection.

O Hisato, N Shizuka - Japanese Journal of Applied Physics, 1999 - cir.nii.ac.jp
抄録 In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to
detect atomic or molecular scale interaction, two types of force sensors were fabricated by …

[引用][C] Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection.

M Kageshima, H Ogiso, S Nakano, MA Lantz… - Japanese Journal of …, 1999 - jlc.jst.go.jp
In order to enhance the lateral force sensitivity of atomic force microscopy (AFM) to detect
atomic or molecular scale interaction, two types of force sensors were fabricated by …

[引用][C] ATOMIC FORCE MICROSCOPY CANTILEVERS FOR SENSITIVE LATERAL FORCE DETECTION

M KAGESHIMA, H OGISO… - Japanese …, 1999 - Japanese journal of applied physics