Compensation of cross talk in the optical lever deflection method used in atomic force microscopy
S Fujisawa, H Ogiso - Review of scientific instruments, 2003 - pubs.aip.org
Most atomic force microscopes employ the optical lever deflection method using a quadrant
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …
Compensation of cross talk in the optical lever deflection method used in atomic force microscopy
S Fujisawa, H Ogiso - Review of Scientific Instruments, 2003 - ui.adsabs.harvard.edu
Most atomic force microscopes employ the optical lever deflection method using a quadrant
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …
photodetector as the displacement sensor of the cantilever, which enables it to detect lateral …
Compensation of cross talk in the optical lever deflection method used in atomic force microscopy
S Fujisawaa, H Ogiso - REVIEW OF SCIENTIFIC INSTRUMENTS, 2003 - pubs.aip.org
The atomic force microscope (AFM) 1 has become a basic tool of science. Most atomic force
microscopes employ the optical lever method2 to detect the displacement of the cantilever …
microscopes employ the optical lever method2 to detect the displacement of the cantilever …