[HTML] mdpi.com

[HTML][HTML] Sub-5 nm AFM tip characterizer based on multilayer deposition technology

Z Wu, Y Xiong, L Lei, W Tan, Z Tang, X Deng, X Cheng… - Photonics, 2022 - mdpi.com
Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
the surface morphology of structures at nanoscale, but the “Inflation effect” of the tip is an …
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Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology

Z Wu, Y Xiong, L Lei, W Tan, Z Tang… - Photonics for Solar …, 2022 - ui.adsabs.harvard.edu
Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
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Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology.

Z Wu, Y Xiong, L Lei, W Tan, Z Tang, X Deng… - …, 2022 - search.ebscohost.com
Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
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Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology

Z Wu, Y Xiong, L Lei, W Tan, Z Tang, X Deng… - …, 2022 - search.proquest.com
Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
the surface morphology of structures at nanoscale, but the “Inflation effect” of the tip is an …
[PDF] academia.edu

[PDF][PDF] Sub-5 nm AFM Tip Characterizer Based on Multilayer Deposition Technology

Z Wu, Y Xiong, L Lei, W Tan, Z Tang, X Deng, X Cheng… - Microscope, 1997 - academia.edu
Atomic force microscope (AFM) is commonly used for three-dimensional characterization of
the surface morphology of structures at nanoscale, but the “Inflation effect” of the tip is an …