Multi-probe atomic force microscopy using piezoelectric cantilevers

N Satoh, E Tsunemi, Y Miyato… - Japanese Journal of …, 2007 - iopscience.iop.org
We developed a multi-probe atomic force microscopy (AFM) system using piezoelectric thin
film (PZT) cantilevers. The use of self-sensing cantilevers with integrated deflection sensors …
被引用次数：27 相关文章
[PDF] researchgate.net

[PDF][PDF] Multi-Probe Atomic Force Microscopy Using Piezoelectric Cantilevers

N SATOH, E TSUNEMI, Y MIYATO… - Japanese Journal of …, 2007 - researchgate.net
We developed a multi-probe atomic force microscopy (AFM) system using piezoelectric thin
film (PZT) cantilevers. The use of self-sensing cantilevers with integrated deflection sensors …

Multi-Probe Atomic Force Microscopy Using Piezoelectric Cantilevers

N Satoh, E Tsunemi, Y Miyato… - … Journal of Applied …, 2007 - ui.adsabs.harvard.edu
We developed a multi-probe atomic force microscopy (AFM) system using piezoelectric thin
film (PZT) cantilevers. The use of self-sensing cantilevers with integrated deflection sensors …

[引用][C] Multi-probe atomic force microscopy using piezoelectric cantilevers

N Satoh, E Tsunemi, Y Miyato - Japanese journal of applied physics. Part …, 2007 - cir.nii.ac.jp
Multi-probe atomic force microscopy using piezoelectric cantilevers | CiNii Research CiNii
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …

[引用][C] Multi-probe atomic force microscopy using piezoelectric cantilevers

N SATOH, E TSUNEMI… - Japanese …, 2007 - Japanese journal of applied physics