Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - iopscience.iop.org
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
被引用次数：32 相关文章
[PDF] researchgate.net

[PDF][PDF] Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - researchgate.net
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements.

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - europepmc.org
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, A Raman, JP Killgore, RC Tung… - Nanotechnology …, 2015 - inis.iaea.org
[en] Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
[PDF] archive.org

[PDF][PDF] Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - scholar.archive.org
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - ui.adsabs.harvard.edu
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung… - …, 2015 - pubmed.ncbi.nlm.nih.gov
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …
[PDF] nist.gov

[PDF][PDF] Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - tsapps.nist.gov
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …

Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, J Killgore, RC Tung, A Raman, DC Hurley - 2015 - nist.gov
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of the AFM cantilever in contact to quantify local …
[PDF] researchgate.net

[PDF][PDF] Vibrational shape tracking of atomic force microscopy cantilevers for improved sensitivity and accuracy of nanomechanical measurements

R Wagner, JP Killgore, RC Tung, A Raman… - …, 2015 - researchgate.net
Contact resonance atomic force microscopy (CR-AFM) methods currently utilize the
eigenvalues, or resonant frequencies, of an AFM cantilever in contact with a surface to …