Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry
R Singh, S Tripathi - Optical and Quantum Electronics, 2019 - Springer
The study involves spectroscopic ellipsometry analysis of sputter deposited few layer MoS 2
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …
Evaluation of optical parameters and characterization of few layer sputtered MoS {sub 2} film by spectroscopic ellipsometry
R Singh, S Tripathi - Optical and Quantum Electronics, 2019 - osti.gov
The study involves spectroscopic ellipsometry analysis of sputter deposited few layer MoS
{sub 2} grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
{sub 2} grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry.
R Singh, S Tripathi - Optical & Quantum Electronics, 2019 - search.ebscohost.com
The study involves spectroscopic ellipsometry analysis of sputter deposited few layer MoS<
sub> 2 grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
sub> 2 grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
[PDF][PDF] Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry
R Singh, S Tripathi - 2019 - academia.edu
The study involves spectroscopic ellipsometry analysis of sputter deposited few layer MoS2
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …
Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry
R Singh, S Tripathi - Optical and Quantum Electronics, 2019 - inis.iaea.org
[en] The study involves spectroscopic ellipsometry analysis of sputter deposited few layer
MoS 2 grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
MoS 2 grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for …
[PDF][PDF] Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry
R Singh, S Tripathi - 2019 - academia.edu
The study involves spectroscopic ellipsometry analysis of sputter deposited few layer MoS2
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …
grown on three different substrates (ITO coated glass, n-silicon and p-silicon) for diverse …