Characterizing atomic force microscopy tip shape in use

C Wang, H Itoh, J Sun, J Hu, D Shen… - … of Nanoscience and …, 2009 - ingentaconnect.com
A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …
被引用次数：15 相关文章

Characterizing atomic force microscopy tip shape in use.

C Wang, H Itoh, J Sun, J Hu, D Shen… - Journal of Nanoscience …, 2009 - europepmc.org
A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

Characterizing atomic force microscopy tip shape in use

C Wang, H Itoh, J Sun, J Hu… - … of nanoscience and …, 2009 - pubmed.ncbi.nlm.nih.gov
A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

Characterizing atomic force microscopy tip shape in use

H Itoh, C Wang, J Sun, J Hu… - … of Nanoscience and …, 2009 - waseda.elsevierpure.com
抄録 A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …

[引用][C] Characterizing Atomic Force Microscopy Tip Shape in Use

C Wang, H Itoh, J Sun, J Hu, D Shen… - Journal of Nanoscience …, 2009 - cir.nii.ac.jp

Characterizing atomic force microscopy tip shape in use

H Itoh, C Wang, J Sun, J Hu… - … of Nanoscience and …, 2009 - waseda.elsevierpure.com
A new tip characterizer based on the fabrication of multilayer thin films for atomic force
microscopy (AFM) was developed to analyze the effective tip shape while in use. The …