Resonant harmonic response in tapping-mode atomic force microscopy
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B Phys …, 2004 - scholar.archive.org
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …
[引用][C] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard, A Atalar - Physical Review B, 2004 - cir.nii.ac.jp
Resonant harmonic response in tapping-mode atomic force microscopy | CiNii Research CiNii
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …
国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ移動 論文・データを …
Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard… - Physical Review B, 2004 - ui.adsabs.harvard.edu
Higher harmonics in tapping-mode atomic force microscopy offers the potential for imaging
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …
and sensing material properties at the nanoscale. The signal level at a given harmonic of the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B Phys …, 2004 - yoksis.bilkent.edu.tr
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B Phys Rev B, 2004 - core.ac.uk
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B …, 2004 - repository.bilkent.edu.tr
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B …, 2004 - repository.bilkent.edu.tr
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …
[PDF][PDF] Resonant harmonic response in tapping-mode atomic force microscopy
O Sahin, CF Quate, O Solgaard - PHYSICAL REVIEW B Phys …, 2004 - scholar.archive.org
The atomic force microscope1 (AFM) is primarily a tool for characterizing surface
topography, but there is always a strong interest in using this technique to study the …
topography, but there is always a strong interest in using this technique to study the …