We propose a novel fabrication process for twin probes of an atomic force microscope (AFM)
that consist of a silicon dual tip with a narrow gap. The dual tip with a tetrahedral shape …

Fabrication of novel silicon dual atomic force microscope tip with narrow gap | CiNii
Research CiNii 国立情報学研究所 学術情報ナビゲータ[サイニィ] 詳細へ移動 検索フォームへ …