Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, S Jang, EH Yang - Measurement Science and Technology, 2009 - iopscience.iop.org
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
[PDF][PDF] Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, EH Yang - Meas. Sci. Technol, 2009 - academia.edu
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, S Jang, EH Yang - Measurement Science and Technology, 2009 - osti.gov
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, S Jang, EH Yang - Measurement Science and …, 2009 - ui.adsabs.harvard.edu
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, S Jang, EH Yang - Measurement Science and Technology, 2009 - inis.iaea.org
[en] A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
[PDF][PDF] Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, EH Yang - Meas. Sci. Technol, 2009 - researchgate.net
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
[PDF][PDF] Step-edge calibration of torsional sensitivity for lateral force microscopy
O Sul, EH Yang - Meas. Sci. Technol, 2009 - academia.edu
A novel calibration technique has been developed for lateral force microscopy (LFM).
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …
Typically, special preparation of the atomic force microscope (AFM) cantilever or a substrate …