[HTML][HTML] A sensitive and versatile thickness determination method based on non-inflection terahertz property fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - mdpi.com
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen… - Sensors (Basel …, 2019 - pubmed.ncbi.nlm.nih.gov
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

[HTML][HTML] A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen, E Pickwell-MacPherson - Sensors (Basel, Switzerland), 2019 - ncbi.nlm.nih.gov
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting.

X Chen, E Pickwell-MacPherson - Sensors (Basel, Switzerland), 2019 - europepmc.org
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

[PDF][PDF] A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - researchgate.net
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

[PDF][PDF] A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - pdfs.semanticscholar.org
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

[引用][C] A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - ui.adsabs.harvard.edu
A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz
Property Fitting - NASA/ADS Now on home page ads icon ads Enable full ADS view …

A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting

X Chen, E Pickwell-MacPherson - Sensors, 2019 - search.proquest.com
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …

A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting.

X Chen, E Pickwell-MacPherson - Sensors (14248220), 2019 - search.ebscohost.com
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the
thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film …