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[HTML][HTML] Scanning force microscope for in situ nanofocused X-ray diffraction studies

MI Richard, JJ Furter - Journal of Synchrotron Radiation, 2014 - scripts.iucr.org
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …
被引用次数：41 相关文章

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok, S Langlais… - Journal of Synchrotron …, 2014 - inis.iaea.org
[en] An atomic force microscope has been developed for combination with sub-micrometer
focused X-ray diffraction at synchrotron beamlines and in situ mechanical tests on single …

Scanning force microscope for in situ nanofocused X-ray diffraction studies.

Z Ren, F Mastropietro, A Davydok… - Journal of …, 2014 - europepmc.org
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …
[HTML] nih.gov

[HTML][HTML] Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok… - Journal of …, 2014 - ncbi.nlm.nih.gov
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …
[PDF] cyberleninka.org

[PDF][PDF] Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok, S Langlais… - J. Synchrotron …, 2014 - cyberleninka.org
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok… - Journal of …, 2014 - pubmed.ncbi.nlm.nih.gov
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …

Scanning force microscope for in situ nanofocused X‐ray diffraction studies

Z Ren, F Mastropietro, A Davydok… - Journal of …, 2014 - Wiley Online Library
A compact scanning force microscope has been developed for in situ combination with
nanofocused X‐ray diffraction techniques at third‐generation synchrotron beamlines. Its …
[HTML] iucr.org

[HTML][HTML] Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok… - Journal of Synchrotron …, 2014 - scripts.iucr.org
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …

Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok, S Langlais… - Journal of Synchrotron …, 2014 - osti.gov
An atomic force microscope has been developed for combination with sub-micrometer
focused X-ray diffraction at synchrotron beamlines and in situ mechanical tests on single …
[HTML] iucr.org

[HTML][HTML] Scanning force microscope for in situ nanofocused X-ray diffraction studies

Z Ren, F Mastropietro, A Davydok… - Journal of …, 2014 - iucrdata.iucr.org
A compact scanning force microscope has been developed for in situ combination with
nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its …