Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - …, 2015 - iopscience.iop.org
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …
被引用次数：22 相关文章

Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, K Youcef-Toumi… - Nanotechnology …, 2015 - inis.iaea.org
[en] High speed imaging and mapping of nanomechanical properties in atomic force
microscopy (AFM) allows the observation and characterization of dynamic sample …
[PDF] aschuh.com

[PDF][PDF] Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - Nanotechnology, 2015 - aschuh.com
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …

Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, I Soltani Bozchalooi, IW Rangelow… - …, 2015 - ui.adsabs.harvard.edu
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …

Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - …, 2015 - pubmed.ncbi.nlm.nih.gov
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …
[PDF] researchgate.net

[PDF][PDF] Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - …, 2015 - researchgate.net
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …
[PDF] aschuh.com

[PDF][PDF] Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - Nanotechnology, 2015 - aschuh.com
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …

Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy.

A Schuh, IS Bozchalooi, IW Rangelow… - …, 2015 - europepmc.org
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …
[PDF] google.com

[PDF][PDF] Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy

A Schuh, IS Bozchalooi, IW Rangelow… - …, 2015 - drive.google.com
High speed imaging and mapping of nanomechanical properties in atomic force microscopy
(AFM) allows the observation and characterization of dynamic sample processes. Recent …