Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Z Yao, X Xia, Y Hou, P Zhang, X Zhai, Y Chen - Nanotechnology, 2019 - iopscience.iop.org
We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers
to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM …
被引用次数：10 相关文章

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Z Yao, X Xia, Y Hou, P Zhang, X Zhai… - …, 2019 - pubmed.ncbi.nlm.nih.gov
We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers
to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM …

Metasurface-enhanced optical lever sensitivity for atomic force microscopy.

Z Yao, X Xia, Y Hou, P Zhang, X Zhai, Y Chen - Nanotechnology, 2019 - europepmc.org
We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers
to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM …

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Z Yao, X Xia, Y Hou, P Zhang, X Zhai… - Nanotechnology (Print), 2019 - inis.iaea.org
[en] We proposed the integration of metasurfaces on atomic force microscopy (AFM)
cantilevers to improve the optical lever sensitivity. The metasurface positioned at the back of …

Metasurface-enhanced optical lever sensitivity for atomic force microscopy

Z Yao, X Xia, Y Hou, P Zhang, X Zhai… - …, 2019 - ui.adsabs.harvard.edu
We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers
to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM …